Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques.
Identifieur interne : 002544 ( Main/Exploration ); précédent : 002543; suivant : 002545Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques.
Auteurs : RBID : pubmed:17722944English descriptors
- KwdEn :
- Arsenicals (chemistry), Computer Simulation, Crystallization (methods), Elasticity, Indium (chemistry), Macromolecular Substances (chemistry), Materials Testing, Models, Chemical, Models, Molecular, Molecular Conformation, Nanotechnology (methods), Nanotubes (chemistry), Nanotubes (ultrastructure), Particle Size, Phosphines (chemistry), Stress, Mechanical, Surface Properties, X-Ray Diffraction (methods).
- MESH :
- chemical , chemistry : Arsenicals, Indium, Macromolecular Substances, Phosphines.
- chemistry : Nanotubes.
- methods : Crystallization, Nanotechnology, X-Ray Diffraction.
- ultrastructure : Nanotubes.
- Computer Simulation, Elasticity, Materials Testing, Models, Chemical, Models, Molecular, Molecular Conformation, Particle Size, Stress, Mechanical, Surface Properties.
Abstract
Quantitative structural information about epitaxial arrays of nanowires are reported for a InAs/InP longitudinal heterostructure grown by chemical beam epitaxy on an InAs (111)B substrate. Grazing incidence X-ray diffraction allows the separation of the nanowire contribution from the substrate overgrowth and gives averaged information about crystallographic phases, epitaxial relationships (with orientation distribution), and strain. In-plane strain inhomogeneities, intrinsic to the nanowires geometry, are measured and compared to atomistic simulations. Small-angle X-ray scattering evidences the hexagonal symmetry of the nanowire cross-section and provides a rough estimate of size fluctuations.
DOI: 10.1021/nl070888q
PubMed: 17722944
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Grazing incidence X-ray diffraction allows the separation of the nanowire contribution from the substrate overgrowth and gives averaged information about crystallographic phases, epitaxial relationships (with orientation distribution), and strain. In-plane strain inhomogeneities, intrinsic to the nanowires geometry, are measured and compared to atomistic simulations. Small-angle X-ray scattering evidences the hexagonal symmetry of the nanowire cross-section and provides a rough estimate of size fluctuations.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="MEDLINE"><PMID Version="1">17722944</PMID><DateCreated><Year>2007</Year><Month>09</Month><Day>12</Day></DateCreated><DateCompleted><Year>2007</Year><Month>11</Month><Day>13</Day></DateCompleted><DateRevised><Year>2013</Year><Month>11</Month><Day>21</Day></DateRevised><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Print">1530-6984</ISSN><JournalIssue CitedMedium="Print"><Volume>7</Volume><Issue>9</Issue><PubDate><Year>2007</Year><Month>Sep</Month></PubDate></JournalIssue><Title>Nano letters</Title><ISOAbbreviation>Nano Lett.</ISOAbbreviation></Journal><ArticleTitle>Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques.</ArticleTitle><Pagination><MedlinePgn>2596-601</MedlinePgn></Pagination><Abstract><AbstractText>Quantitative structural information about epitaxial arrays of nanowires are reported for a InAs/InP longitudinal heterostructure grown by chemical beam epitaxy on an InAs (111)B substrate. Grazing incidence X-ray diffraction allows the separation of the nanowire contribution from the substrate overgrowth and gives averaged information about crystallographic phases, epitaxial relationships (with orientation distribution), and strain. In-plane strain inhomogeneities, intrinsic to the nanowires geometry, are measured and compared to atomistic simulations. Small-angle X-ray scattering evidences the hexagonal symmetry of the nanowire cross-section and provides a rough estimate of size fluctuations.</AbstractText></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Eymery</LastName><ForeName>Joël</ForeName><Initials>J</Initials><Affiliation>CEA Grenoble, Département de Recherche Fondamentale sur la Matière Condensée, Service des Matériaux et Microstructures, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France. joel.eymery@cea.fr</Affiliation></Author><Author ValidYN="Y"><LastName>Rieutord</LastName><ForeName>François</ForeName><Initials>F</Initials></Author><Author ValidYN="Y"><LastName>Favre-Nicolin</LastName><ForeName>Vincent</ForeName><Initials>V</Initials></Author><Author ValidYN="Y"><LastName>Robach</LastName><ForeName>Odile</ForeName><Initials>O</Initials></Author><Author ValidYN="Y"><LastName>Niquet</LastName><ForeName>Yann-Michel</ForeName><Initials>YM</Initials></Author><Author 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